Particle contamination control = Defectivity
Particle on wafer front side kills one die, die is fully processed providing no value for the customer.
- Importance of defectivity and contamination control within semiconductor industry.
- Defectivity within ASML.
- Critical defect size.
- Contamination control approach (product lifecycle and defectivity chain).
- Clean parts strategy.
- Surface cleanliness – particles measurement.
- Examples how manufacturing and machining processes contribute to defectivity.
- Summary and conclusions.
The aim of the Manufacturing Technology Conference is to bring together technicians from the design and manufacturing industry to share knowledge about manufacturability. With this annual Manufacturing Technology Conference, we increase knowledge about manufacturability for developers and help them look for possibilities that were previously unknown.
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