Measuring
White Light Interferometry for Highest Precision 3D-Structure Measurements by Mitutoyo Nederland BV
White Light Interferometry (WLI) uses the interference signal of a broadband light source for highest accuracy, non-contact 3D measurements like for profile or roughness measurements down to a nanometer scale. With new developed WLI objective lenses, the common technology of WLI is driven to its edge.
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