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Measuring
Optical inspection in focus by Mitutoyo Nederland BV
With this unique technique the scan range of the focal position of an optical system can be increased by a factor of up to 20+ times. This enhanced depth of focus (EDOF) results in sharp images even for 3D structures that standard optics cannot capture all-in-focus in just one shot.
Presentation and poster will be available at 17 april 2025