Measuring

Enhanced Statistical Process Control applied to AM by Hexagon SPC for AM

That root cause analysis will help identify correlations between process parameters and occurring defects using AI/ML methods to meet Industry 4.0 expectations. This enhanced SPC approach allows us to detect potential defects earlier or even before they happen and thus reduce the number of failed parts in production. Potentially, this approach may also help reduce the efforts in Computed Tomography (CT) and NDT activity.

Hexagon SPC for AM

Brainport Industries Campus – Cluster 1, BIC 1 5657 BX Eindhoven
Nederland
+31 (0)40 222 2210 jan.klingen@hexagon.com www.hexagon.com

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